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DS: Fachverband Dünne Schichten

DS 25: Symposium: Real Time Growth Studies III

DS 25.5: Vortrag

Donnerstag, 29. März 2007, 17:00–17:15, H32

Real-time growth investigations by means of reflectance difference spectroscopy — •Michael Hohage, Lidong Sun, Richard Denk, Günther Weidlinger, Jose Manuel Flores-Camacho, and Peter Zeppenfeld — Institut für Experimentalphysik, Johannes Kepler Universität Linz, A-4040 Linz, Austria

Reflectance difference spectroscopy (RDS) has been proven to be a versatile tool to study growth processes on crystalline substrates in-situ and in real-time. RDS measures the difference in the reflectivity of light polarized along two orthogonal directions. Since RDS uses light with normal incidence, it measures the in-plane anisotropy of a sample. For crystals with cubic symmetry the bulk is not contributing to the optical anisotropy, so that the RDS signal is only introduced by an anisotropic surface. The growth on an anisotropic substrate may influence the optical anisotropy signal either by changing the anisotropy of intrinsic surface transitions (e.g. scattering of surface states), by modifying substrate transitions due to anisotropic strain fields beneath the growing structures, or by introducing specific transitions of the deposited material (e.g. HOMO-LUMO transitions of orientated organic molecules). Simultaneously to the investigation of the morphology, the out of plane magnetization of a growing film may be studied by RDS via the polar magneto-optical Kerr effect (MOKE). The capabilities of RDS regarding the real-time investigation of growth will be demonstrated by introducing growth systems where the mentioned effects have been identified.