Regensburg 2007 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
DS: Fachverband Dünne Schichten
DS 26: Oxides
DS 26.8: Talk
Thursday, March 29, 2007, 16:45–17:00, H34
The amorphous to crystalline phase transition of chemical solution deposited PbZr1−xTixO3, studied by soft-x-ray spectroscopy — Timorthy Learmonth1,4, Jinghua Guo1, Jonathan Denlinger1, Per Glans1,4, •Hermann Kohlstedt2, Theo Schneller3, Adrian Petraru2, Rainer Waser2,3, Kevin Smith4, and Ramamorthy Ramesh5 — 1Advanced Light Source, Lawrence Berkeley National Laboratory, USA — 2Inst. für Festkörperforschung, Germany — 3Inst. für Werkstoffe der Elektrot. II, RWTH Aachen, Germany, — 4Depart. of Physics, Boston University,Massachusetts 02215, USA — 5Depart. of Mat. Sci. and Eng.,Berkeley, CA 94720 USA
Chemical solution deposited (CSD) complex oxide thin films attract considerable interest in various emerging research fields. Here we present our results of soft-x-ray spectroscopy between 100 eV and 2 keV on the amorphous to crystalline phase transition of ferroelectric PbZr0.3Ti0.7O3 thin films. Five samples from the same wafer were annealed to different temperatures between 350∘C and 700∘C. The soft-x-ray absorption and emission experiments were performed at the undulator beamline 8.0 of the Advanced Light Source of the Lawrence Berkeley National Laboratory. The soft-x-ray spectra were acquired for the Ti L2,3-, O K-and C K-edge thresholds. For two samples, annealed up to 400∘C and 700∘C, respectively, the resonant inelastic soft-x-ray spectroscopy (RIXS) was applied for various excitation energies near the Ti L-, O K- and C K-edges. Current models of the PZT (111) microscopic texture selection will be discussed.