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15:00 |
DS 26.1 |
XPS study of Pr-aluminate high-k dielectric layers on titanium nitride — •Grzegorz Lupina, Thomas Schroeder, Christian Wenger, Gunther Lippert, Jarek Dabrowski, and Hans-Joachim Müssig
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15:15 |
DS 26.2 |
Structural Determination of thin Manganese Oxide Films on Ag(001) — •Christian Langheinrich, Angelika Chassé, Frank Müller, and Stefan Hüfner
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15:30 |
DS 26.3 |
Epitaxially stabilized growth of orthorhombic LuScO3 thin films — •Tassilo Heeg, Martin Roeckerath, Jürgen Schubert, Willi Zander, Christoph Buchal, Han Yuan Chen, Chunlin Jia, Yunfa Jia, Carolina Adamo, and Darrell G. Schlom
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15:45 |
DS 26.4 |
Tunable Electron Gases in Oxide Hetrostructures — •Stefan Thiel, German Hammerl, Christoph Richter, Andreas Schmehl, Christof Schneider, and Jochen Mannhart
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16:00 |
DS 26.5 |
Unusual Enhancement of Laser Induced Voltages in (LPMO/YBCO)n Multilayer Thin Films — •Pengxiang Zhang, Hui Zhang, Lilan Xie, Xinkun Zhu, Songlin Tan, and Hanns-Ulrich Harbermeier
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16:15 |
DS 26.6 |
Ag-doped LaPbMnO3 thin films and laser induced thermoelectric voltages — •Pengxiang Zhang, Songlin Tan, Hui Zhang, and Hanns-Urlich Habermeier
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16:30 |
DS 26.7 |
GaPO4 epitaxial thin films: Growth and thermal stability — •Johannes Pedarnig, Stefan Roither, Martin Peruzzi, and Dieter Bäuerle
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16:45 |
DS 26.8 |
The amorphous to crystalline phase transition of chemical solution deposited PbZr1−xTixO3, studied by soft-x-ray spectroscopy — Timorthy Learmonth, Jinghua Guo, Jonathan Denlinger, Per Glans, •Hermann Kohlstedt, Theo Schneller, Adrian Petraru, Rainer Waser, Kevin Smith, and Ramamorthy Ramesh
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17:00 |
DS 26.9 |
Structure Formation and Phase Composition of Zirconia Films grown by High Power Pulsed Magnetron Sputtering (HPPMS) — •Christian Klever, Kostas Sarakinos, and Matthias Wuttig
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17:15 |
DS 26.10 |
Light-induced processes on electrochromic WO3 layers — •Thomas Leichtweiß, Bruno K. Meyer, Angelika Polity, Thomas Löwenstein, Derck Schlettwein, Jeremy Matthews, and Dirk Jödicke
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17:30 |
DS 26.11 |
Characterization of GdScO3 layers by Spectroscopic Ellipsometry — Martin Roeckerath, •Jürgen Moers, Jürgen Schubert, and Siegfried Mantl
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