Regensburg 2007 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 13: Poster 1

HL 13.8: Poster

Monday, March 26, 2007, 15:00–17:30, Poster A

Preparation, characterization and measurements of graphene layers on SiO₂ substrates — •Ulrich Stöberl, Tobias Feil, Michael Huber, and Dieter Weiss — Institut für Experimentelle und Angewandte Physik, Universität Regensburg, 93040 Regensburg, Germany

In the last two years quite a number of fundamental experimental results on graphene were published and sparked a lot of interest in this new material. Graphene is a monolayer of graphite and comes up with some new characteristics such as a linear dispersion relation or its field effect which allows to tune via a gate voltage from an electron to a hole system. Furthermore graphene is theoretically well understood; although it was not available for experiments yet. We present the preparation of graphene layers of different thicknesses. Starting materials are highly ordered pyrolytic graphite (HOPG) and graphite flakes. Different techniques are used to superimpose the graphene layers to the SiO₂. We show first gate voltage dependent measurements in van-der-Pauw geometry. Additionally the roughness of multi layer graphene surfaces with different thicknesses was determined by means of AFM.