Regensburg 2007 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 37: Symposium Graphene

HL 37.2: Invited Talk

Thursday, March 29, 2007, 10:30–11:00, H15

Raman Imaging of Graphene — Davy Graf, Francoise Molitor, •Klaus Ensslin, Christoph Stampfer, Alain Jungen, and Christopher Hierold — Physics Department, ETH Zurich

We present Raman spectroscopy measurements on single- and few-layer graphene flakes. Using a scanning confocal approach we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double-and few-layer by the width of the D* line: the single peak for single-layer graphene splits into different peaks for the double-layer. We investigate the D-line intensity and find no defects within the flake. We also present transport measurements through few layer graphene systems. The inelastic scattering length is estimated from measurements of universal conductance fluctuations to be of the order of several micrometers at low temperatures.

INVITED TALK