Regensburg 2007 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 4: Semiconductor Laser I
HL 4.3: Talk
Monday, March 26, 2007, 11:15–11:30, H13
Measurement of the linewidth enhancement factor of semiconductor lasers — •Wolfgang Rick1, Jens von Staden1, Tobias Gensty1, Guido Guiliani2, and Wolfgang Elsäßer1 — 1Institut für Angewandte Physik, Technische Universität Darmstadt, Schloßgartenstraße 7, D-64289 Darmstadt — 2Dipartimento di Elettronica, Università di Pavia, Via Ferrata 1, I-27100 Italy
We present measurements of the linewidth enhancement factor of different semiconductor laser structures using the interferometric self-mixing technique [1]. In our experiments the laser is simultaniously used as emitter and detector, i.e. the self-mixing signal can be obtained by measuring the voltage variations across the laserchip. An alternative possibility is to measure the selfmixing-waveform with a classical setup using a monitor photodiode. In this work both methods are compared with respect to their potential to measure the alpha-factor. We find the electrical signal to be the first choice because of its better signal-to-noise-ratio. Also we present a statistical analysis of the alpha-measurement that allows to determine alpha and its FWHM and gives an overview of its temporal development. Finally we report on our results measuring the alpha-factor of a Quantum Dot laser.
[1] Y. Yu, G. Giuliani and S. Donati, IEEE Photon. Technol. Lett., vol. 16, pp. 990-992, April 2004.