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HL: Fachverband Halbleiterphysik

HL 46: Poster 2

HL 46.57: Poster

Donnerstag, 29. März 2007, 15:00–17:30, Poster A

Optical and structural properties of NiO and NiMnO thin films grown on ZnO and sapphire substrates — •Lars Hartmann¹, Qingyu Xu¹, Heidemarie Schmidt¹, Holger Hochmuth¹, Michael Lorenz¹, Marius Grundmann¹, Pablo Esquinazi¹, Mario Saenger², Tino Hofmann², Mathias Schubert², and Sy-Hwang Liou³ — ¹Universität Leipzig, Fakultät für Physik und Geowissenschaften, Institut für Experimentelle Physik II, Linnéstrasse 5, D-04103 Leipzig, Germany — ²Department of Electrical Engineering, University of Nebraska-Lincoln 209N WSEC P.O. Box 880511 Lincoln, NE 68588-0511, USA — ³Department of Physics and Astronomy, Nebraska Center for Materials and Nanoscience

Antiferromagnetic NiO is one of the key materials to realize spin valves in diluted magnetic semiconductors. In our current work we present the possibility of epitaxially growing NiO thin films on ZnO and sapphire substrates with different orientations. The magnetic properties of the films have been probed by SQUID measurements and the optical properties have been investigated by spectral ellipsometry from the near IR to the near UV range. The crystal structure and the film orientation was investigated by X-ray diffraction. Combined AFM and MFM measurements are showing a smooth surface structure and provide the possibility to investigate the magnetic properties of the sample surface. Especially the epitaxial growth of NiO on magnetic ZnO is an important step towards the realization of ZnO based spin valves.