Regensburg 2007 – scientific programme
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MA: Fachverband Magnetismus
MA 15: Poster:ThinFilms(1-33),Transp.(34-49),ExchBias(50-56),
Spindynamics(57-70),Micro-nanostr.Mat.(71-82),
Particles/Clust.(83-88), Mag.Imag./Surface(89-96),
Spinelectronics(97-109), Theory/Micromag.(110-116),
Spinstruct/Phasetr.(117-128),Magn.Mat.(129-139),
Aniso.+Measuring(140-145), MolMag.(146-152),
MSMA(153-156)
MA 15.122: Poster
Tuesday, March 27, 2007, 15:00–19:00, Poster A
Static Characterization of the Antiferromagnetic-To-Ferromagnetic Phase Transition of FeRh Thin Films — •Paul Ramm1, Ilie Radu1, Alexander Weber1, Christian Back1, Christian Stamm2, Torsten Kachel2, Niko Pontius2, Hermann Dürr2, Jörg Raabe3, Christoph Quitmann3, Luiic Joly3, and Jan-Ulrich Thiele4 — 1Institut für Angewandte und Experimentelle Physik, Universität Regensburg, Germany — 2BESSY GmbH, Berlin, Germany — 3Paul Scherrer Institut, Villingen PSI, Switzerland — 4Hitachi Global Storage Technologies, San Jose Research Center, USA
The antiferromagnetic-to-ferromagnetic phase transition present on the FeRh thin film alloy is studied by employing static magneto-optic Kerr effect (MOKE), X-ray magnetic circular dichroism (XMCD) and X-ray photoemission electron microscopy (XPEEM) techniques, which give information on the average magnetization, the element-specific magnetic moments as well as the domain structure, respectively.
The element-specific hysteresis provided by the XMCD measurements near the transition temperature reveal the growth of the Fe magnetic moment and development of the small but crucial induced Rh magnetic moment in the ferromagnetic phase.
Using temperature dependent XPEEM in the vicinity of the phase transition we observe the formation and the partial reproducibility of the magnetic domain structure. The temperature hysteresis of the magnetic contrast deduced from the XPEEM data is in good agreement with the temperature dependent MOKE measurements.