Regensburg 2007 – scientific programme
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MA: Fachverband Magnetismus
MA 15: Poster:ThinFilms(1-33),Transp.(34-49),ExchBias(50-56),
Spindynamics(57-70),Micro-nanostr.Mat.(71-82),
Particles/Clust.(83-88), Mag.Imag./Surface(89-96),
Spinelectronics(97-109), Theory/Micromag.(110-116),
Spinstruct/Phasetr.(117-128),Magn.Mat.(129-139),
Aniso.+Measuring(140-145), MolMag.(146-152),
MSMA(153-156)
MA 15.24: Poster
Tuesday, March 27, 2007, 15:00–19:00, Poster A
X-ray magnetic linear dichroism in reflection and absorption spectra measured in the vicinity of the L2,3 edges of ultrathin cobalt films on W(110) — •Nagamony Ponpandian, Armin Kleibert, Stefan Gutzeit, Stefan Polei, and Karl-Heinz Meiwes-Broer — Institut für Physik, Universität Rostock, Universitätsplatz 3, D-18051 Rostock
X-ray magnetic linear dichroism (XMLD) is a valuable tool to measure the magnetocrystalline anisotropy energy (MAE) of thin films and multilayers in an element specific and even in laterally resolved manner. Normally, the XMLD in absorption is a quite weak effect in the important case of the 3d transition metals. However, recent experiments revealed a strong enhancement in XMLD-type effects when detecting the specular reflectivity instead of the absorption. In order to investigate the origin of this enhancement we studied the XMLD both in absorption and reflection in epitaxially grown Co films on W(110). These samples possess atomically flat interfaces and thus are well suited for reflectivity experiments. Moreover, they exhibit a thickness dependent MAE. In this contribution we will compare the experimentally observed effects in reflection with respective calculations based on a 4×4-matrix formalism. Furthermore, we will address the anisotropy in the shape of the XMLD spectra and its theoretically predicted relation to the thickness dependent MAE of the Co films.