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MA: Fachverband Magnetismus
MA 15: Poster:ThinFilms(1-33),Transp.(34-49),ExchBias(50-56),
Spindynamics(57-70),Micro-nanostr.Mat.(71-82),
Particles/Clust.(83-88), Mag.Imag./Surface(89-96),
Spinelectronics(97-109), Theory/Micromag.(110-116),
Spinstruct/Phasetr.(117-128),Magn.Mat.(129-139),
Aniso.+Measuring(140-145), MolMag.(146-152),
MSMA(153-156)
MA 15.55: Poster
Dienstag, 27. März 2007, 15:00–19:00, Poster A
Resonant magnetic x-ray reflectivity on Co/Cu/Co — •Valeriano Ferreras Paz, Sebastian Brück, Eberhard Goering, and Gisela Schütz — Max Planck Institut für Metallforschung, Heisenbergstr. 3, 70569 Stuttgart
The interaction between ferromagnetic layers across a nonmagnetic or isolating spacer layer has reached great technological importance during the last years, i.e. GMR sensors. A Co/Cu/Co has been grown epitaxially on a Cu (100) single crystal substrate by molecular beam epitaxy. The quality of the film is controlled by LEED and TEM. On this system resonant magnetic x-ray reflectivity measurements were performed at BESSY II, which allows the determination of the magnetic depth profile in an element selective way. This has been done on the Co and Cu L3 edge in order to learn more about the origin of the oscillatory exchange coupling in such systems.
References:
J. Geissler et al. Phys. Rev. B 65, 020405 (2001)
P. Bruno J. Phys.: Condens. Matter 11 9403-9419 (1999)
M. G. Samant et al. Phys. Rev. Lett. 72, 1112 - 1115 (1994)