Regensburg 2007 – scientific programme

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MA: Fachverband Magnetismus

MA 15: Poster:ThinFilms(1-33),Transp.(34-49),ExchBias(50-56),
Spindynamics(57-70),Micro-nanostr.Mat.(71-82),
Particles/Clust.(83-88), Mag.Imag./Surface(89-96),
Spinelectronics(97-109), Theory/Micromag.(110-116),
Spinstruct/Phasetr.(117-128),Magn.Mat.(129-139),
Aniso.+Measuring(140-145), MolMag.(146-152),
MSMA(153-156)

MA 15.89: Poster

Tuesday, March 27, 2007, 15:00–19:00, Poster A

Quantitative Magnetic Imaging using Combined Magnetooptics and Magnetic Force Microscopy — •Sibylle Sievers¹, Sebastian Dreyer², Joachim Lüdke¹, Martin Albrecht¹, Uwe Siegner¹, and Christian Jooss² — ¹Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany — ²Institut für Materialphysik, Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany

We present our results on the stray field calibration of a magnetic force microscope (MFM) based on a combination of MFM with magnetooptics using indicator films (MOIF). The MFM stray field measurements are not quantitative unless the measured signal is calibrated. The mosts general calibration ansatz based on a transfer function is pursued by Hug and coworkers [1]. Our groups are working on a transfer function based calibration ansatz using reference samples with well defined stray field distribution. As reference samples patterned hard magnetic FePt films which exhibit out-of-plane easy magnetization axes were produced. MOIF in combination with inverse and forward magnetostatic calculation techniques and micromagnetic simulations allows for a complete characterization of the magnetization and the stray field of the reference samples. This is the prerequisite for a calibration of the MFM signal. The results on the combined MFM and MOIF characterization of reference samples will be presented.

[1] P.J.A. van Schendel, H.J. Hug, B. Stiefel, S. Martin, and H.J. Güntherodt, J. Appl. Phys. 88 (2000) 435.