Regensburg 2007 – wissenschaftliches Programm
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MA: Fachverband Magnetismus
MA 15: Poster:ThinFilms(1-33),Transp.(34-49),ExchBias(50-56),
Spindynamics(57-70),Micro-nanostr.Mat.(71-82),
Particles/Clust.(83-88), Mag.Imag./Surface(89-96),
Spinelectronics(97-109), Theory/Micromag.(110-116),
Spinstruct/Phasetr.(117-128),Magn.Mat.(129-139),
Aniso.+Measuring(140-145), MolMag.(146-152),
MSMA(153-156)
MA 15.9: Poster
Dienstag, 27. März 2007, 15:00–19:00, Poster A
Growth and characterization of Ni2MnIn Heusler films — •Jan Michael Scholtyssek, Lars Bocklage, Rainer Anton, Ulrich Merkt, and Guido Meier — Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Universität Hamburg, Jungiusstr. 11, 20355 Hamburg
Heusler alloys are interesting materials for spintronic devices. We grow thin Ni2MnIn films by coevaporation of Ni and the alloy MnIn on a variety of substrates including amorphous carbon films and Si3N4 membranes for TEM studies as well as on Si and InAs for investigations of the electronic interface structure. The latter is especially interesting because of the predicted halfmetallicity of Ni2MnIn in the L21 phase at the interface to InAs [1]. The almost perfect lattice match between InAs and Ni2MnIn supports highly oriented growth, as we have proven by electron diffraction under grazing incidence [2]. We present morphologic and structural investigations performed during a post growth annealing process in which the sample grown at a substrate temperature of 100 ∘C is heated up to 400 ∘C. The formation of the L21 crystal structure presumably in coexsistence with the B2 phase is observed. Point contact Andreev-reflection spectroscopy on Ni2MnIn thin films grown on Si and on (110)-surfaces of InAs, perpared by in-situ cleaving of the substrate, yields spin polarizations of up to 34% [3].
K.A. Kilian and R.H. Victora, J. Appl. Phys. 87, 7064 (2000).
J.M. Scholtyssek et. al., J. Magn. Magn. Mat. accepted (2006).
L. Bocklage et. al., J. Appl. Phys. accepted (2006).