Regensburg 2007 – scientific programme
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MA: Fachverband Magnetismus
MA 23: Micro- and Nanostructured Magnetic Materials I
MA 23.7: Talk
Thursday, March 29, 2007, 11:45–12:00, H22
Lorentz microscopy studies of cross-tie states in multi-scale NiFe elements — •Nils Wiese1, Stephen McVitie1, John Chapman1, Felix Otto2, Stefan Müller3, and Antonio DeSimone4 — 1University of Glasgow, Dept. for Physics & Astronomy, Glasgow, United Kingdom — 2Institut für Angewandte Mathematik der Universität Bonn, Germany — 3Max Planck Institute for Mathematics in the Sciences, Leipzig, Germany — 4Intern. School for Advanced Studies, Trieste, Italy
Modelling of the magnetic structure and magnetisation processes in discrete thin films is routinely achieved using micromagnetic methods. However, in certain cases micromagnetics may not give accurate predictions and a particular example where this can apply is for structures containing extended domain walls, e.g. cross-tie walls. In such cases, analytical models provide an alternative route for predicting the behaviour on the micromagnetic scale.
We have fabricated elongated rectangular permalloy elements of varying thickness and with in-plane dimensions down to 100nm in order to investigate variation in the cross-tie wall structure due to edge proximity compared to that in an infinite film. Domain structures have been characterised in remanent states and during in-situ magnetising experiments in the transmission electron microscope. Our results show that the cross-tie density depends on the element width although the basic geometry of the wall remains unaltered. Results will be presented showing the variation of the wall structure over a large range of lengthscales, and a comparision with analytical models will be made.