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MA: Fachverband Magnetismus

MA 26: Exchange Bias

MA 26.9: Vortrag

Donnerstag, 29. März 2007, 17:15–17:30, H10

Magnetic depth profiling of an exchange bias system: x-ray resonant magnetic reflectivity of FeMn/Co. — •Sebastian Brück, Valeriano Ferreras-Paz, Eberhard Goering, and Gisela Schütz — Max-Planck-Institut für Metallforschung, Heisenbergstraße 3, D-70569 Stuttgart

X-ray Resonant Magnetic Reflectivity (XRMR) extends reflectivity by the x-ray magnetic circular dichroism as additional contrast thus providing element selective magnetic depth information. This makes it a perfect tool to investigate magnetic coupling effects in multi-layered systems. Such systems are for example ferromagnet-antiferromagnet bilayers which can show an exchange coupling between the two layers, the so called exchange bias effect. We present results on Co/FeMn bilayers which have been investigated by XRMR at the BESSY II synchrotron, Berlin. The bilayers were prepared by molecular beam epitaxy on a Cu (100) single crystal which ensures epitaxial growth of both FeMn (in the antiferromagnetic phase) and Co. The magnetic depth profile for room temperature and for 120 K is investigated with respect to changes of the exchange coupling.