Regensburg 2007 – scientific programme

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MA: Fachverband Magnetismus

MA 27: Micro- and Nanostructured Magnetic Materials II

MA 27.9: Talk

Thursday, March 29, 2007, 17:15–17:30, H22

On the analysis of results from x-ray magnetic reflectometry for magnetic multilayer systems — •Manfred Fähnle, Daniel Steiauf, Larry Martosiswoyo, Eberhard Goering, Sebastian Brück, and Gisela Schütz — Max-Planck-Institut für Metallforschung, Heisenbergstraße 3, 70569 Stuttgart

The resonant magnetic x-ray reflectometry is sometimes used to determine the orientations and the magnitudes of magnetic moments in crystallographically inequivalent layers of a multilayer system. We comment on the use of this method to investigate the magnitudes of the magnetic moments, in particular on the basic assumption that the layer-resolved magnetic contributions to the optical constants are proportional to the magnetic moments in these layers. Within the two-step model of magnetic x-ray dichroism it is discussed under what circumstances this assumption may be at least approximately valid. Results of explicit calculations within the framework of the ab-initio density functional electron theory are reported for the multilayer system (Co₂Pt₇).