Regensburg 2007 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 14: SYM Micro- and Nanomechanics II

MM 14.6: Talk

Tuesday, March 27, 2007, 12:00–12:15, H16

Stress measurments in small dimensions using Confocal Raman Microscopy: a probe for stress and defect density — •Thomas Wermelinger, Cesare Borgia, Christian Solenthaler, and Ralph Spolenak — Lab. for Nanometallurgy, ETH Zurich, 8093 Zürich, Schweiz

Confocal Raman microscopy is a powerful tool for measuring stresses with a lateral resolution in the submicron range in 3D, which as previously only been possible by synchrotron based X-ray techniques. Moreover, it is possible to observe phase transformations, which appear due to high compressive stresses. Residual 3D stress fields in a sapphire single crystals after indentation are analysed. It can be shown that the symmetry of the residual stress field solely depends on the crystal symmetry and not on the symmetry of deformation. A direct correlation between defect structures observed by TEM and the peak broadening in the Raman spectra was found. Raman spectroscopy offers new potential in micro- and nanomechanics.