Regensburg 2007 – scientific programme
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MM: Fachverband Metall- und Materialphysik
MM 14: SYM Micro- and Nanomechanics II
Tuesday, March 27, 2007, 10:15–12:15, H16
10:15 | MM 14.1 | Invited Talk: Micromechanics inside the SEM — •Benedikt Moser | |
10:45 | MM 14.2 | Scaling in the mechanical properties of thin metal films: from the micro- to the nanoscale — •Ralph Spolenak | |
11:15 | MM 14.3 | Direct-Observation Nanomechanical Testing in a Transmission Electron Microscope — •Oden Warren and Ude Hangen | |
11:30 | MM 14.4 | Bulge Testing of Thin Films in an Atomic Force Microscope — •Elmar W. Schweitzer and Mathias Göken | |
11:45 | MM 14.5 | Mechanical properties of micro bending-beams: a comparison between discrete dislocation dynamic simulations and experiments — •Christian Motz, Daniel Weygand, and Peter Gumbsch | |
12:00 | MM 14.6 | Stress measurments in small dimensions using Confocal Raman Microscopy: a probe for stress and defect density — •Thomas Wermelinger, Cesare Borgia, Christian Solenthaler, and Ralph Spolenak | |