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MM: Fachverband Metall- und Materialphysik

MM 5: Interfaces I

MM 5.1: Vortrag

Montag, 26. März 2007, 10:15–10:30, H6

Stress Induced Migration of <100> Tilt Grain Boundaries in Al-Bicrystals — •Tatiana Gorkaya, Dmitri Molodov, and Günter Gottstein — Institut für Metallkunde und Metallphysik, RWTH Aachen, 52056 Aachen

The stress induced migration of planar grain boundaries in aluminium bicrystals was measured. Both low- and high angle symmetrical <100> tilt grain boundaries with misorientation angles in the range between 3.5° and 23.0° were examined. Boundary migration under a shear stress was observed to be ideally coupled to the lateral translation of grains. The measured ratios of the normal boundary motion to the lateral displacement of grains are in an excellent agreement with the respective boundary geometry. The temperature dependence of grain boundary mobility was measured in the temperature range between 290°C and 390°C, and the corresponding activation parameters were determined. The activation enthalpy of boundary migration was found to be independent of misorientation angle in the investigated misorientation range and amounts to H=1.44 eV.