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14:15 |
O 15.1 |
Advances in High Resolution 3-Dimensional Force Field Spectroscopy — •Alexander Schwarz, Uwe Kaiser, and Roland Wiesendanger
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14:30 |
O 15.2 |
Measuring energy dissipation in torsional resonance mode AFM using frequency modulation — •Ayhan Yurtsever, Alexander M. Gigler, and Robert W. Stark
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14:45 |
O 15.3 |
Frequency Modulation Dynamic Force Microscopy applying amplitudes in the low nm range: Questions, findings — •Georg Hermann Simon, Markus Heyde, Hans-Peter Rust, and Hans-Joachim Freund
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15:00 |
O 15.4 |
Optimum excitation and detection of cantilever oscillations in vacuum — •Jannis Lübbe, Stefan Torbrügge, Sebastian Gritschneder, Lutz Tröger, Holger Schnieder, Toyoaki Eguchi, Yukio Hasegawa, and Michael Reichling
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15:15 |
O 15.5 |
Increasing the Q-factor in the constant-excitation mode of frequency-modulation atomic force microscopy in liquid — •Daniel Ebeling, Hendrik Hölscher, Jan-Erik Schmutz, and Boris Anczykowski
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15:30 |
O 15.6 |
Influence of the Local Adsorption Environment on the Intra-Molecular Contrast of Organic Molecules in Non-Contact Atomic Force Microscopy — •Andre Schirmeisen, Bartosz Such, Domenique Weiner, and Harald Fuchs
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15:45 |
O 15.7 |
Kelvin Probe Force Microscopy on Electrically Inhomogeneous Fe/W(001) Films — •Ung Hwan Pi, Rene Schmidt, Alexander Schwarz, and Roland Wiesendanger
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16:00 |
O 15.8 |
Contact area dependence of friction on the nanoscale — •Dirk Dietzel, Tristan Mönninghoff, Andre Schirmeisen, Harald Fuchs, and Udo Schwarz
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16:15 |
O 15.9 |
Design of a High-Frequency Electric-Force Scanning Force Microscope for Vibration Spectroscopy at Single Macromolecules — Patrick Steffen, Ivo Knittel, and •Uwe Hartmann
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16:30 |
O 15.10 |
Optimum Excitation Conditions for SNOM-based Particle-enhanced Fluorescence Microscopy — •Thomas Härtling, Phillip Reichenbach, Marc-Tobias Wenzel, Phillip Olk, and Lukas Eng
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16:45 |
O 15.11 |
Second-harmonic near-field optical microscope in illumination mode — •Georgios Ctistis and Paul Fumagalli
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17:00 |
O 15.12 |
Infrared Mapping of Material and Doping Contrasts in Microelectronic Devices at Nanoscale Spatial Resolution — •A. Huber, J. Wittborn, F. Keilmann, and R. Hillenbrand
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17:15 |
O 15.13 |
A 30-nm-wide slit as a waveguide for light to the aperture of a near-field optical probe — •Daniela Diessel, Nicole Neuberth, Fabián Pérez-Willard, and Andreas Naber
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17:30 |
O 15.14 |
Electrical Characterization of individual nanowires with the LEEPS microscope — •Dirk Henning Weber, André Beyer, Berthold Völkel, Armin Gölzhäuser, Bianca Postels, Andreas Waag, Martin Gräser, Andreas Greiner, and Joachim Wendorff
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