Regensburg 2007 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 17: Poster Session I (Nanostructures at Surfaces; Metal Substrates: Epitaxy and Growth; Methods: Scanning Probe Techniques; Phase Transitions)
O 17.46: Poster
Montag, 26. März 2007, 17:30–20:30, Poster C
Strategies for manipulation of nanometer-scale metallic islands in ultrahigh vacuum by atomic force microscopy techniques — •T. Mönninhoff1, D. Dietzel1,2, A. Schirmeisen1, H. Fuchs1,2, and U. D. Schwarz3 — 1Inst. of Physics, University of Münster, Germany — 2Forschungszentrum Karlsruhe, Germany — 3Dept. of Mechanical Engineering, Yale University, New Haven, USA
The fundamentals of friction are still insufficiently understood, in particular the relation between friction force and contact area. Conventional friction force microscopy is unsuitable in this regard due to the ill-defined tip-sample-contact. This limitation can be circumvented by investigating evaporated metal islands with a well-defined and clean contact to the substrate. Using appropriate scanning parameters for AFM contact mode operation, it is possible to move the metallic islands on the substrate. Simultaneously, the friction can be measured by the torsion of the cantilever. In this work, we have focused on the manipulation of antimony islands on graphite samples. Two different strategies have been applied. In the 1st approach, a predefined sample area has been scanned with a normal force close to the threshold of lateral manipulation. In this case, multiple manipulations of islands orthogonal to the fast scan direction make the interpretation difficult. Therefore a 2nd strategy has been developed, where high load was applied only at a few lines, yielding well-defined displacement events. Before and after the contact-mode manipulation the area was imaged using non-contact techniques, avoiding unwanted manipulation of small islands.