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O: Fachverband Oberflächenphysik

O 17: Poster Session I (Nanostructures at Surfaces; Metal Substrates: Epitaxy and Growth; Methods: Scanning Probe Techniques; Phase Transitions)

O 17.53: Poster

Monday, March 26, 2007, 17:30–20:30, Poster C

Experimental setup of a combined scanning tunnelling microscope and atomic force microscope at ultrahigh vacuum conditions and low temperature — •Thomas König, Georg Hermann Simon, Markus Heyde, Hans-Peter Rust, and Hans-Joachim Freund — Fritz-Haber-Institute of the Max-Planck-Society, Faradayweg 4-6, D-14195 Berlin, Germany

Scanning tunnelling microscopy (STM) is sensitive to the electronic structure of conducting and semiconducting samples. A different technique which has been improved over the last years is the atomic force microscope (AFM). This technique gained atomic resolution on metals [1], semi conductors [2] and insulators [3] and has still not reached its limit in scientific work. Here we present the experimental setup and challenges of our combined STM and AFM in an ultrahigh vacuum chamber at low temperatures. Our setup is similar to the one developed by P.S. Weiss et al. [4]. An insight into the sensor setup of the microscope will be given as well as description of our amplifier arrangement [5]. Moreover we point out the next challenges we are facing on the way to enhanced the sensitivity of our combined STM and AFM.

[1] Ch. Loppacher, M. Bammerlin, M. Guggisberg, S. Schär, R. Bennewitz, A. Baratoff, E. Meyer, H.J. Güntherrodt, Phys. Rev. B, 62, 16944 (2000). [2] Y. Sugawara, M. Ohta, H. Ueyama, S. Morita, Science, 270, 1646 (1995). [3] C. Barth and M. Reichling, Nature, 414, 54 (2001). [4] P.S. Weiss, D.M. Eigler, NATO ASI Series E, 235, 213 (1993). [5] H.-P. Rust, M. Heyde, H.-J. Freund, Rev. Sci. Instr., 77, 043710 (2006).