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O: Fachverband Oberflächenphysik

O 17: Poster Session I (Nanostructures at Surfaces; Metal Substrates: Epitaxy and Growth; Methods: Scanning Probe Techniques; Phase Transitions)

O 17.59: Poster

Montag, 26. März 2007, 17:30–20:30, Poster C

Towards the ultimate STM: design, modeling and characterization — •Mark den Heijer, Vincent Fokkema, Arjen C. Geluk, and Marcel J. Rost — Kamerlingh Onnes Laboratory, Leiden University, P.O.Box 9504, 2300 RA Leiden, The Netherlands

We developed a video-rate scanning tunneling microscope (STM) for in-situ and real-time observation of film growth. The key element in achieving high frame rates is a rigid mechanical structure, but the objective of imaging the surface during deposition poses severe restrictions on the geometry of the STM.

To achieve an optimal design we used finite element analysis (FEA) to model the complete STM. By including damping and piezoelectric properties, we obtained not only the eigenfrequencies and eigenmodes but also the real amplitudes of the vibrations. Finally we compare our calculated predictions with the measured characteristics of the microscope.