Regensburg 2007 – scientific programme
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O: Fachverband Oberflächenphysik
O 17: Poster Session I (Nanostructures at Surfaces; Metal Substrates: Epitaxy and Growth; Methods: Scanning Probe Techniques; Phase Transitions)
O 17.63: Poster
Monday, March 26, 2007, 17:30–20:30, Poster C
Conductivity of Thin Films and Nanostructures Analysed by EFM — •Thomas Koch1,2, Patrick Dupeyrat1,2, Roland Gröger1,2, Sheng Zhong1,2, Norman Mechau2, Gabi Schierning2, Roland Schmechel2, and Thomas Schimmel1,2 — 1Institute of Applied Physics, University of Karlsruhe, D-76128 Karlsruhe, Germany — 2Institute of Nanotechnology (INT), Forschungszentrum Karlsruhe, D-76021 Karlsruhe, Germany
ITO (Indium Tin Oxide), Si or Ge nano-particles and small micron and submicron metal structures, mixed together with polymers and other carrier systems, are promising materials in the field of micro electronics and especially printable electronics to build thin conducting or dielectric films. Independently pure nano-particle systems or metals are also of interest for these applications.[1] For the exploration of these topics AFM is a powerful tool which can give information to identify the electric properties of materials at surfaces with local contrast on the nanometer scale. In this work we demonstrate the use of Electrostatic Atomic Force Microscopy (EFM) to map the conductive properties of nano-particle based sintered thin ITO films, of ITO/Baytron composite systems and of metal based ribbon cable nano structures. References 1. J. R. Sheats, J. Mater Res. 19 (7), 1974, (2004)