Regensburg 2007 – scientific programme

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O: Fachverband Oberflächenphysik

O 44: Poster Session II (Semiconductors; Oxides and Insulators: Adsorption, Clean Surfaces, Epitaxy and Growth; Surface Chemical Reactions and Heterogeneous Catalysis; Surface or Interface Magnetism; Solid-Liquid Interfaces; Organic, Polymeric, Biomolecular Films; Particles and Clusters; Methods: Atomic and Electronic Structure; Time-resolved Spectroscopies)

O 44.45: Poster

Wednesday, March 28, 2007, 17:00–19:30, Poster C

Spatially resolved photoemission measurements using reflective photon sieves — •Matthias Kalläne, Tim Riedel, Dirk Rahn, Sönke Harm, Kai Roßnagel, Jens Buck, Martin Marczynski-Bühlow, Claas Thede, and Lutz Kipp — Institut für Experimentelle und Angewandte Physik, Universität Kiel, D-24098, Germany

A new angle and spatially resolved photoemission experiment is being set up, which exploits a SPECS PHOIBOS 150 analyzer with a 2–dimensional CCD detector, and a grazing incidence photon sieve — a new type of diffraction optics for focusing synchrotron radiation with suppressed side lobes and reduced background [1]. In order to test the setup before its planned use at the VUV–FEL monochromator beamline at HASYLAB, we carried out experiments at beamline BW3 of the storage ring DORIS III at HASYLAB with a photon energy of 100 eV. The photoemission measurements were done on the transition-metal dichalcogenide misfit compound (PbS)_1.13TaS₂ which consists of layers of cubic PbS and hexagonal 2H–TaS₂ subsystems. After cleavage in UHV the surface typically shows islands of both subsystems with sizes in the µm regime. The spatially resolved core level measurements are compared to spatially resolved spectra taken at the photoelectron microscope beamline BL31 at MAX–lab in Lund.

This work is supported by Innovationsfond des Landes Schleswig-Holstein.

[1] L. Kipp, M. Skibowski, R.L. Johnson, R. Berndt, R. Adelung, S. Harm and R. Seemann, Nature 414, 184 (2001).