Regensburg 2007 – scientific programme
Parts | Days | Selection | Search | Downloads | Help
O: Fachverband Oberflächenphysik
O 44: Poster Session II (Semiconductors; Oxides and Insulators: Adsorption, Clean Surfaces, Epitaxy and Growth; Surface Chemical Reactions and Heterogeneous Catalysis; Surface or Interface Magnetism; Solid-Liquid Interfaces; Organic, Polymeric, Biomolecular Films; Particles and Clusters; Methods: Atomic and Electronic Structure; Time-resolved Spectroscopies)
O 44.67: Poster
Wednesday, March 28, 2007, 17:00–19:30, Poster C
Surface science approach to study surface and interface properties of room temperature ionic liquids — •Oliver Höfft1, Stephan Bahr1, Volker Kempter1, Marcel Himmerlich2, Stefan Krischok2, Maxim Eremtchenko2, Yonghe Liu2, Rolf Öttking2, Anita Neumann2, Jens Uhlig2, Pierre Lorenz2, Imad Ahmed2, and Jürgen Schaefer2 — 1Institut für Physik und Physikalische Technologien, TU Clausthal, 38678 Clausthal-Zellerfeld, Germany — 2Institut für Physik und Institut für Mikro- und Nanotechnologien, TU Ilmenau, 98684 Ilmenau, Germany
Despite the immense importance of the surface and interface properties of ambient temperature ionic liquids for technical applications, only a few surface sensitive investigations have been performed to date. Therefore, we have chosen the latter approach under well defined ultra high vacuum conditions in order to get some first insight into different surface and interface related properties of liquids like [EMIM]Tf2N. We used ultraviolet and X-ray radiation (20 eV up to 1500 eV), metastable helium atoms and primary electrons by applying a number of techniques like UPS, MIES, XPS, HREELS. The emitted photoelectrons and the elastically and/or inelastically scattered electrons give some first detailed information about the elemental composition, the electronic and vibronic structure and about its radiation induced changes. Some of the experimental results are compared with first principle calculations (DFT-LSDA). Our present status of understanding will be discussed in detail at the conference.