Regensburg 2007 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 44: Poster Session II (Semiconductors; Oxides and Insulators: Adsorption, Clean Surfaces, Epitaxy and Growth; Surface Chemical Reactions and Heterogeneous Catalysis; Surface or Interface Magnetism; Solid-Liquid Interfaces; Organic, Polymeric, Biomolecular Films; Particles and Clusters; Methods: Atomic and Electronic Structure; Time-resolved Spectroscopies)
O 44.79: Poster
Mittwoch, 28. März 2007, 17:00–19:30, Poster C
Depth profiling of thin film solar cell components by synchrotron excited Soft X-Ray Emission Spectroscopy (SXES) — •Harry Mönig1, Markus Bär3, Christian Camus2, Ahmed Ennaoui2, Alexander Grimm1, Christian Jung4, Christian Kaufmann2, Paul Körber2, Timo Kropp2, Iver Lauermann2, Sebastian Lehmann2, Martha Lux-Steiner1,2, Tim Münchenberg2, Paul Pistor2, Stefan Puttnins2, Rodrigo Saez-Araoz1, Hans-Werner Schock2, Stefan Sokoll2, and Christian-Herbert Fischer1,2 — 1Freie Universität Berlin — 2Hahn-Meitner-Institut Berlin — 3University of Las Vegas — 4BESSY GmbH Berlin
Depending on the elemental composition of a material, SXES provides an information depth of 50-1000 nm. For studies of thin multilayer structures tuning of this parameter is highly desirable. One possibility is the variation of the excitation energy, which is accompanied by variation of photoionisation cross sections. Alternatively, we performed angle resolved SXES on the solar cell absorber material Cu(In,Ga)Se2 covered by CdS or Zn(S,O) buffer layers (10-50 nm). Due to our setup geometry, the emission spectra clearly display increased surface sensitivity at small (grazing exit) and large (grazing incidence) exit angles. A model based on Beer-Lamberts law and setup geometry is in reasonable agreement with our experimental data.The presented results show that angle resolved SXES measurements yield depth-dependent information on multilayer structures. The increased surface sensitivity at grazing exit and grazing incidence angles allows the detection of extremely thin cover layers at reasonable recording times.