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O: Fachverband Oberflächenphysik
O 52: Methods: Atomic and Electronic Structure II
O 52.5: Talk
Thursday, March 29, 2007, 12:15–12:30, H42
Spectro-Microscopy with very high resolution demonstrated at selected surface systems — •Florian Maier1, Helder Marchetto2, Ulrich Groh1, Pierre Levesque2, Tomas Skala2, Thomas Schmidt1, Rainer Fink3, Hans-Joachim Freund2, Eberhard Umbach1, and the SMART-Collaboration1,2,3,4 — 1Universität Würzburg, Experimentelle Physik II, 97074 Würzburg — 2Fritz-Haber-Institut der Max-Planck-Gesellschaft, 14159 Berlin — 3Univ. Erlangen-Nürnberg, Phys. Chemie II, 91058 Germany — 4TU Clausthal, TU Darmstadt, ZEISS Oberkochen, BESSY Berlin
The aberration corrected spectro-microscope SMART has been developed for all kinds of photo emission (PEEM) and low energy electron microscopy (LEEM) with outstanding lateral and energy resolution. The recent performance of the well operating instrument is shown, and the capabilities of spectroscopic imaging will be demonstrated for selected sample systems. We will especially concentrate on the adsorption behaviour of the organic molecule PTCDA(3,4,9,10-perylene-tetracarboxylic-acid dianhydride) on Ag(111) and Au(111) surfaces. For example, local work function, spectroscopic information, and even structural differences can be used for image contrast formation. This also allows correlating the substrate morphology with, e.g., the interaction with the organic molecules and even, by taking advantage of the high instrumental transmission, to observe directly, i.e. in real time and in situ, the growth of interface systems. (Funded by BMBF, contract 05KS4WWB/4)