Regensburg 2007 – scientific programme
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O: Fachverband Oberflächenphysik
O 8: Methods: Scanning Probe Techniques I
O 8.3: Talk
Monday, March 26, 2007, 11:45–12:00, H41
Identification of vibrations in video-speed SPM scanners — •G.J.C. van Baarle1,2, P. Schakel1, L. Crama1, T.H. Oosterkamp1, J.W.M. Frenken1, and M.J. Rost1,2 — 1Kamerlingh Onnes Laboratory, Leiden University, P.O. box 9504, 2300 RA Leiden, The Netherlands — 2Leiden Probe Microscopy, P.O. box 9504, 2300 RA Leiden, The Netherlands
For a wide variety of surface and interface phenomena in both fundamental and applied contexts, it is becoming increasingly important to visualize them with atomic or molecular resolution combined with high speeds.
In order to avoid crashes while scanning rough surfaces at high speeds, one has to be able to perform high speed feedback on the probe position. We will demonstrate that the excitation of vibrations in the microscope sets a limit to the resolution as well as the speed of the measurement. We will present a very sensitive method to measure the vibrations in an STM.
From the experimental data obtained with this method we can clearly identify the origin of vibrations. We will show that the obtained information can be used to tune the PI-regulator settings optimally, without having any 'a priori' knowledge of the closed loop transfer function of the entire system.