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SYOE: Symposium Organic Thin Film Electronics: From Molecular Contacts to Devices
SYOE 8: Poster Session SYOE
SYOE 8.23: Poster
Tuesday, March 27, 2007, 18:00–20:00, Poster B
Initial growth of evaporated copper phthalocyanine thin-films - — •Biswas Indro1, Peisert Heiko1, Nagel Mathias1, Casu Maria Benedetta1, Schuppler Stefan2, Nagel Peter2, Pellegrin Eric2,3, and Chassé Thomas1 — 1Institut für Physikalische und Theoretische Chemie, Universität Tübingen, Auf der Morgenstelle 8, 72076 Tübingen, Germany — 2Forschungszentrum Karlsruhe, Institut für Festkörperphysik, P. O. Box 3640, 76021 Karlsruhe, Germany — 3Consorcio para la Construcción, Equipamiento y Explotación del Laboratorio de Luz de Sincrotrón, P. O. Box 68, 08193 Bellaterra (Barcelona), Spain
The growth of copper phthalocyanine thin films evaporated on polycrystalline gold is examined in detail, using near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and surface-sensitive x-ray photoemission spectroscopy (SXPS). Measurements were done at the Angstroemquelle Karlsruhe ANKA (WERA beamline). The molecular orientation of thin-films between 0.2 to 3 nm thickness was examined, focussing on the layers directly at the interface. By utilising the different surface sensitivities of both methods, it was possible to distinguish between the uppermost layer and the layer directly at the interface to gold. It was found that about three layers at the interface grow parallel to the substrate surface, whereas subsequent molecules are perpendicular oriented. Thus, the buried interfacial layer(s) in thin film systems can be differently oriented compared to the majority of molecules.