Regensburg 2007 – scientific programme

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SYOE: Symposium Organic Thin Film Electronics: From Molecular Contacts to Devices

SYOE 8: Poster Session SYOE

SYOE 8.23: Poster

Tuesday, March 27, 2007, 18:00–20:00, Poster B

Initial growth of evaporated copper phthalocyanine thin-films - — •Biswas Indro¹, Peisert Heiko¹, Nagel Mathias¹, Casu Maria Benedetta¹, Schuppler Stefan², Nagel Peter², Pellegrin Eric^2,3, and Chassé Thomas¹ — ¹Institut für Physikalische und Theoretische Chemie, Universität Tübingen, Auf der Morgenstelle 8, 72076 Tübingen, Germany — ²Forschungszentrum Karlsruhe, Institut für Festkörperphysik, P. O. Box 3640, 76021 Karlsruhe, Germany — ³Consorcio para la Construcción, Equipamiento y Explotación del Laboratorio de Luz de Sincrotrón, P. O. Box 68, 08193 Bellaterra (Barcelona), Spain

The growth of copper phthalocyanine thin films evaporated on polycrystalline gold is examined in detail, using near-edge x-ray absorption fine structure (NEXAFS) spectroscopy and surface-sensitive x-ray photoemission spectroscopy (SXPS). Measurements were done at the Angstroemquelle Karlsruhe ANKA (WERA beamline). The molecular orientation of thin-films between 0.2 to 3 nm thickness was examined, focussing on the layers directly at the interface. By utilising the different surface sensitivities of both methods, it was possible to distinguish between the uppermost layer and the layer directly at the interface to gold. It was found that about three layers at the interface grow parallel to the substrate surface, whereas subsequent molecules are perpendicular oriented. Thus, the buried interfacial layer(s) in thin film systems can be differently oriented compared to the majority of molecules.