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SYOE: Symposium Organic Thin Film Electronics: From Molecular Contacts to Devices

SYOE 8: Poster Session SYOE

SYOE 8.35: Poster

Tuesday, March 27, 2007, 18:00–20:00, Poster B

Evolution of structure and morphology of perylene films with different thicknesses and deposition rates — •Maryam Beigmohamadi, Phenwisa Niyamakom, Azadeh Farahzadi, Stephan Kremers, Christian Effertz, Philip Schulz, Thomas Michely, and Matthias Wuttig — Institute of Physics (IA), RWTH Aachen University of technology 52056 Aachen, Germany

A systematic study of the growth of highly ordered perylene films deposited on amorphous substrates is presented. The dependence of the structure and morphology of the films on thickness and deposition rate is characterized by Atomic Force Microscopy (AFM) and X- ray Diffraction (XRD). Atomic force microscopy reveals that every grain contains at least one screw dislocation. An analysis of the XRD peak profiles allowed us to determine the microstrain and vertical grain size. The changes of grain size and dislocation density with thickness and deposition rate have been analyzed.