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SYOE: Symposium Organic Thin Film Electronics: From Molecular Contacts to Devices

SYOE 8: Poster Session SYOE

SYOE 8.99: Poster

Dienstag, 27. März 2007, 18:00–20:00, Poster B

Instabilities and Dynamic Behavior of the Potential Distribution in Organic FETs — •Christopher Siol, Niels Benson, Christian Melzer, and Heinz von Seggern — Electronic Materials Department, Institute of Materials Science, Darmstadt University of Technology, Petersenstr. 23, 64287 Darmstadt, Germany

Kelvin probe force microscopy (KPFM) has recently been used to investigate lateral surface potential distributions in the channel of organic field effect transistors (OFETs). This methodology offers a microscopic view on electronic mechanisms in the transistor beyond the macroscopic information of output and transfer characteristics. In this work, frequency modulated KPFM under ultra high vacuum conditions is used to measure the surface potential distributions between source and drain of top and bottom contact pentacene OFETs. The electric force is detected by measuring the frequency modulation of the cantilever oscillation, allowing high lateral resolution. In particular, the instabilities of OFET characteristics during constant electrical stress are compared to the changes in the potential distribution. Additionally, the dynamic response of the surface potential on a time-dependent operation will be correlated with the overall temporal change in the current.