Regensburg 2007 – wissenschaftliches Programm
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TT: Fachverband Tiefe Temperaturen
TT 20: Correlated Electrons - Poster Session
TT 20.41: Poster
Mittwoch, 28. März 2007, 14:00–17:45, Poster A
Spectral line shapes in soft x-ray diffraction — •C. Schüßler-Langeheine, J. Schlappa, M. W. Haverkort, and L. H. Tjeng — II. Physikalisches Institut, Universität zu Köln
Resonant diffraction in the soft x-ray range is a powerful spectroscopic method to study order phenomena like charge, spin and orbital order as they are found in correlated electron systems. In particular this technique is capable to differentiate between true modulations of the electronic states and pure modulations of the lattice like strain waves. For energetically sharp resonances like the L2,3 thresholds of transition metals, the spectral shape of the diffraction spectrum differs significantly between a predominantly structural and a predominantly electronic superstructure. This difference is caused by the interference of resonant and non-resonant scattering, which acts differently in the two cases and can be used as a qualitative fingerprint of the two scenarios. Supported by the DFG through SFB 608.