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TT: Fachverband Tiefe Temperaturen

TT 8: Superconductivity - Poster Session

TT 8.2: Poster

Montag, 26. März 2007, 14:00–17:45, Poster A

TEM analysis of biaxially textured La₂Zr₂O₇ thin films by the Moiré technique — •Leopoldo Molina¹, Kerstin Knoth², Bernhard Holzapfel², and Oliver Eibl¹ — ¹Institute of Applied Physics, University of Tübingen, Auf der Morgenstelle 10, D-72076, Tübingen, Germany — ²IFW Dresden, P.O.Box 270116, D-01171 Dresden, Germany

Chemically deposited La₂Zr₂O₇(LZO) buffer layers on biaxially textured nickel tungsten substrates for YBa₂Cu₃O_7−δ(YBCO) coated conductor technology have been investigated by transmission electron microscopy (TEM). The biaxially textured LZO thin films were 80 nm thick and were annealed at T = 900^∘C. The samples were then prepared in plan-view for TEM investigations. The Ni grain size is about 40 µm, whereas the grain size of the LZO films is about 100 nm. The Moiré fringe contrast magnifies the misorientation of the LZO grains with respect to the underlying Ni grain by about a factor of 10. Imaging of small rotations (≤3^∘) of the LZO grains with respect to the underlying nickel tungsten grains was possible. Thus, the large misfit of 7.6 % between the LZO film and the nickel tungsten substrate might be additionally compensated by the tilting of the small LZO grains rather than by only introducing misfit dislocations at the substrate-film interface.