Berlin 2008 – scientific programme
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 14: Membranes
CPP 14.2: Talk
Tuesday, February 26, 2008, 15:15–15:30, C 230
Novel carbon nanomembranes as support for ultrahigh resolution structural analysis of nanoparticles — •Christoph Nottbohm1, André Beyer1, Alla Sologubenko2, Inga Ennen1, Andreas Hütten1, Harald Rösner3, Wolfgang Eck4, Joachim Mayer2, and Armin Gölzhäuser1 — 1Fakultät für Physik, Universität Bielefeld — 2RWTH Aachen — 3Forschungszentrum Karlsruhe — 4Universität Heidelberg
The resolution in transmission electron microscopy (TEM) has reached values as low as 0.08 nm. However, these values are not accessible for very small objects in the size range of a few nanometers or lower as they have to be placed on some support, which contributes to the overall electron scattering signal, thereby blurring the contrast. Here, we report on the use of nanomembranes made from cross-linked aromatic self-assembled monolayers as TEM sample supports. When transferred onto a copper grid, a single 1.6 nm thick nanomembrane can cover the entire grid and is free-standing within the micron-sized openings. Despite its thinness, the membrane is stable under the impact of the electron beam. Micrographs taken from nanoclusters onto these nanomembranes show highly increased contrast in comparison to images taken from amorphous carbon supports. In scanning transmission electron microscopy with nanomembrane support, a size analysis of sub-nanometer Au clusters was performed and single Au atoms were resolved.