DF 5: Scanning and diffraction methods
Montag, 25. Februar 2008, 14:30–17:30, EB 407
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14:30 |
DF 5.1 |
Hauptvortrag:
Behaviour of Ferroelectrics Influenced by Nanoscale Morphology — •john martin gregg, alina schilling, liwu chang, mark mcmillen, mohamed saad, robert bowman, gustau catalan, james scott, and finlay morrison
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15:10 |
DF 5.2 |
Fourier analysis of ferroelectric polarization reversal — •Andreas Rüdiger
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15:30 |
DF 5.3 |
Complete reconstruction of the piezoelectric tensor in BaTiO3 nanoislands — •Sebastian Albiez, Serge Röhrig, and Andreas Rüdiger
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15:50 |
DF 5.4 |
Electromechanical force microscopy as a non-destructive detection of local inhomgeneities with nanoscale — •Serge Röhrig and Andreas Rüdiger
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16:10 |
DF 5.5 |
Growth of C60 islands on TiO2(110) — •Felix Loske, Frank Ostendorf, Michael Reichling, and Angelika Kühnle
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16:30 |
DF 5.6 |
Atomic scale evidence for faceting stabilization of a polar oxide — •Frank Ostendorf, Stefan Torbrügge, and Michael Reichling
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16:50 |
DF 5.7 |
Phonon resonances in ferroelectrics probed with scattering scanning near-field optical microscopy (s-SNOM) using a free-electron laser — •Lukas Eng, Susanne Schneider, Stefan Grafström, Stephan Winnerl, and Manfred Helm
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17:10 |
DF 5.8 |
Time-resolved X-ray diffraction studies of piezoelectric actuators — •Florian Rödl, Peter Wochner, Ralf Weigel, and Helmut Dosch
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