Berlin 2008 – scientific programme

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DF: Fachverband Dielektrische Festkörper

DF 9: Poster

DF 9.14: Poster

Tuesday, February 26, 2008, 15:00–18:00, Poster G

Amplitude-Frequency-Characteristics of Ferroelectric ThinFilms — •Kay Barz, Martin Diestelhorst, and Horst Beige — Martin Luther-Universität Halle-Wittenberg

The dielectric properties of ferroelectric thin films are commonly studied by means of low-frequency or quasi-static methods (capacitance-voltage, current-voltage, hysteresis). We pursue a different approach by investigating the frequency response of a LCR series-resonant circuit containing a ferroelectric thin film as capacitance. The poster presents amplitude-frequency-characteristics (AFC) observed at different types of thin film samples (Metal/Ferroelectric/Metal and Metal/Ferroelectric/Semiconductor). The differences among them are pointed out and a comparison is made with respect to the typical response of a ferroelectric bulk material.

The results show, how hysteresis and its transient alterations due to fatigue manifest in a shift of resonance frequency. This behaviour can be simulated numerically, and thus explain the observed deviations of the AFC from a linear response.