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Berlin 2008 – scientific programme

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DF: Fachverband Dielektrische Festkörper

DF 9: Poster

DF 9.4: Poster

Tuesday, February 26, 2008, 15:00–18:00, Poster G

Interface properties of PbTiO3 and PZT thin films on Pt-terminated substrates — •Salah Habouti1, Claus-Henning Solterbeck1, Mohammed Es-Souni1, Vladimir Zaporojtchenko2, and Franz Faupel21Institute for Materials and Surface Technology, University of Applied Sciences Kiel — 2Chair for Multicomponent Materials, Christian-Albrechts-Universtät zu Kiel

Electrical properties of Pb(Zr0.52Ti0.48)O3 (PZT) and PbTiO3 thin films are influenced by processes at the interface with the substrate. These interfaces are investigated for sol-gel processed thin films on Pt-terminated substrates. XPS depth profiles from samples prepared at various temperatures and in situ XRD measurements at different temperatures reveal the stochiometry and transformation kinetics at the interfaces. An intermediate phase with Pt and Pb emerges at the beginning of the film formation, but it disappears completely when the crystallization is complete.

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