Berlin 2008 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
DS: Fachverband Dünne Schichten
DS 12: Thin Film Characterisation: Structure Analyse and Composition (XRD, TEM, XPS, SIMS, RBS, ...)
DS 12.7: Vortrag
Dienstag, 26. Februar 2008, 13:15–13:30, H 2013
Thermal Stability of Cs Fullerides — •Daniel Löffler, Patrick Weis, Sharali Malik, Artur Böttcher, and Manfred Kappes — Institut für Physikalische Chemie, Universität Karlsruhe, 76131 Karlsruhe, Germany
Thermal stability of solid Cs fullerides fabricated under ultra high vacuum conditions has been investigated by means of thermal desorption spectroscopy, ultraviolet photoelectron spectroscopy and secondary electron microscopy. The incorporation of Cs atoms proceeds by the formation of CsxC60 grains. The stability of CsxC60 depends on the doping degree x, 1≤x≤6. Weakly doped phases, Csx<4C60, decompose in three channels manifested by C60 sublimation peaks, α at 570 K, β at 660-720 K and γ at 820-900 K. Channel α reveals the sublimation of C60 molecules from sample regions not involved in the formation of fulleride grains. Sublimation channel β represents thermal desorption of C60 molecules terminating CsxC60 grains, x=1-3. The latter result from the phase segregation nC60m− ←→ C60 + mC60n−, m=2,3, n=m+1 as activated during heating the sample [1]. The binding energy of C60 cages to the grain surface has been found to vary slightly with x in the range from 1.75 eV up to 1.95 eV. Saturated CsxC60, 4≤x≤6, phases decompose only via channel γ by sublimation of CsxC60 cages.
[1] G. Klupp et al., Phys. Rev. B, 74 (2006) 195402