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Berlin 2008 – scientific programme

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DS: Fachverband Dünne Schichten

DS 15: Functional Oxides

DS 15.5: Talk

Tuesday, February 26, 2008, 16:15–16:30, H 2032

Laser-assisted deposition and element analysis of nano-composite oxide thin films — •Johannes Pedarnig1,2, Johannes Heitz1,2, Thomas Stehrer1,2, Bernhard Praher1,2, Richard Viskup1,2, Khurram Siraj2, Andreas Moser2, Angela Vlad2, Marius Bodea2, Dieter Bäuerle2, N. Hari Babu3, and David Cardwell31Christian Doppler Laboratory for Laser-Assisted Diagnostics, — 2Institute of Applied Physics, Johannes Kepler University Linz, A-4040 Linz, Austria — 3Department of Engineering and IRC in Superconductivity, University of Cambridge,

Functional oxide thin films are epitaxially grown by pulsed-laser deposition (PLD) method. High-Tc superconducting (HTS) films of enhanced critical current density Jc are deposited by laser ablation of YBa2Cu3O7 (Y-123) ceramics containing Y2Ba4CuMOx (M-2411, M = Ag, Nb, Ru, Zr) nano-particles. The Jc enhancement of nano-composite films depends on the secondary phase content of the ceramic targets. Piezoelectric oxides such as novel GaPO4 and ZnO doped with Lithium and Aluminum are grown as thin films and double-layers.

The monitoring of deposition processes and the element analysis of layers and ceramics are performed by laser-induced break down spectroscopy (LIBS). The LIBS signals recorded in situ are stable for more than 10000 laser pulses employed for target ablation. The relative element concentration in thin films and ceramics is the same demonstrating stoichiometric ablation and transfer of the multi-component oxide materials.

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