Berlin 2008 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 18: Poster: Towards Molecular Spintronics, Organic Thin Films, Optical Layers, Vibrational Spectroscopy, Tayloring organic interfaces

DS 18.21: Poster

Dienstag, 26. Februar 2008, 14:30–19:30, Poster A

Ellipsometry Investigation of Pentacene Thin Films — •Marion Friedrich, Daniel Lehmann, Falko Seidel, and Dietrich R. T. Zahn — TU Chemnitz, Institut für Physik, 09107 Chemnitz, Germany

Thin pentacene layers with thicknesses ranging between 20 and 150 nm were prepared by organic molecular beam deposition on native oxide covered silicon substrates. Variable angle spectroscopic ellipsometry was applied aiming at the determination of thicknesses and dielectric function of pentacene thin films. Starting with the assumption that the optical properties are the same, the optical constants of several films with different thickness were coupled and fitted together with the film thicknesses in a multi-sample analysis procedure. For thickness determination different models are employed and discussed regarding their deviation from the measurement results. Best agreement between simulation and experiment was found for a model implying uniaxial films. As a result of further detailed data evaluation in the absorbing spectral range a difference in the dielectric functions for thin and thick layers was determined.