Berlin 2008 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 18: Poster: Towards Molecular Spintronics, Organic Thin Films, Optical Layers, Vibrational Spectroscopy, Tayloring organic interfaces
DS 18.34: Poster
Dienstag, 26. Februar 2008, 14:30–19:30, Poster A
Infrared Synchrotron Mapping Ellipsometry of biomolecular thin films — •Dana Maria Rosu1, Ullrich Schade2, Norbert Esser1, and Karsten Hinrichs1 — 1ISAS- Institute for Analytical Sciences, Department Interface Spectroscopy, Albert-Einstein-Str. 9, 12489 Berlin, Germany — 2BESSY GmbH, Albert-Einstein-Str. 15, 12489 Berlin, Germany
The IR synchrotron ellipsometer at BESSY II, for the mid infrared range, enables investigation of samples with monolayer sensitivity and a lateral resolution below 1 mm2. Being equipped with a mapping table [1], the set-up allows the investigation of heterogeneous organic thin films. In cooperation with Sentech Instruments the IR synchrotron mapping ellipsometer was upgraded with a rotating retarder. In the recent years IR ellipsometry has been applied for structural analysis of thin organic films [2]. Results from mapping ellipsometry of biosensors [3] and molecular monolayers, with thicknesses between 2 nm and 100 nm, will be presented. Evaluation of measured spectra with optical models gives informations about thickness, homogeneity and orientation of the molecules on the substrates.
[1] M. Gensch, N. Esser, E. H. Korte, U. Schade, K. Hinrichs, Infrared Phys. and Technol. 49(1-2)(2006) 39-44
[2] K. Hinrichs, M. Gensch, N. Esser, Appl. Spectrosc. 59 (2005) 272A-282A
[3] K. Hinrichs, M. Gensch, N. Esser, U. Schade, J. Rappich, S. Kröning, M. Portwich, R. Volkmer, Anal. and Bioanal. Chem. 387(5)(2007) 1823-1829