Berlin 2008 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 3: Organic Thin Films
DS 3.6: Vortrag
Montag, 25. Februar 2008, 15:45–16:00, H 2013
Quantitative evaluation of the anisotropy of the optical constants of phthalocyanine thin films — •Michael Fronk, Dietrich R.T. Zahn, and Georgeta Salvan — Physics Department, Chemnitz University of technology, D-09107 Chemnitz
In this work copper phthalocyanine films prepared by organic molecular beam deposition on silicon substrates with thicknesses of about 60 nm are investigated by means of variable angle spectroscopic ellipsometry (VASE) and reflection anisotropy spectroscopy (RAS). The ellipsometry results indicate an uniaxial symmetry of the organic films with the uniform optical constants in the film plane different from those out of plane. RAS shows in addition the presence of an in-plane optical anisotropy in the order of 10−3 to 10−2 that is too small to be detected by ellipsometry. The RAS data is analysed using the layer model "air - film - substrate". Considering that the incident light is composed of two parts polarised linearly parallel to the main axes of the in-plane anisotropy we calculate the difference of the optical constants of the organic film along the two axes. This allows to estimate the degree of preferential orientation of the molecules within the film plane.