Berlin 2008 – scientific programme

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DS: Fachverband Dünne Schichten

DS 37: Vibrational Spectroscopy of Nanolayers with Optical Probes

DS 37.2: Invited Talk

Friday, February 29, 2008, 14:00–14:30, H 2013

Near-field Infrared Nanoscopy and Nanospectroscopy — •Rainer Hillenbrand — Nano-Photonics Group, Max-Planck-Institut für Biochemie, 82152 Martinsried, Germany — CIC NanoGUNE Consolider, 20009 San Sebastian, Spain

Comprehensive material analysis in thin films and nanostructures requires ultrahigh-resolution microscopy providing high sensitivity to chemical composition, structural properties and local conductivity, among others. Conventional far-field optical spectroscopy offers such sensitivity, however, diffraction limits the spatial resolution to half the illumination wavelength. Near-field optical microscopy (SNOM) can overcome this drawback. Particularly its scattering-type version (s-SNOM) allows optical imaging with nanoscale spatial resolution, independent of the wavelength. In s-SNOM, the elastically scattered light from the laser illuminated tip of an atomic force microscope is recorded, simultaneously to topography.

Besides of a short introduction to the s-SNOM technique, I will demonstrate mid-infrared microscopy and spectroscopy at 20-30 nm spatial resolution. Applications such as material-specific imaging of thin films and single nanoparticles [1-3] and free carrier mapping in semiconductor devices [4] will be demonstrated.

[1] A. Cvitkovic, et al., Phys. Rev. Lett. 97, 060801 (2006)

[2] M. Brehm, et al., Nano Lett. 6, 1307 (2006).

[3] A. Cvitkovic, N. Ocelic, R. Hillenbrand, Nano Lett. 7, 3177 (2007)

[4] A. Huber, et al., Adv. Mater. 19, 2209 (2007)