Berlin 2008 – scientific programme

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HL: Fachverband Halbleiterphysik

HL 17: Poster I

HL 17.32: Poster

Monday, February 25, 2008, 16:30–19:00, Poster D

Correlation of grain structure and electrical properties of Cu(In,Ga)Se₂ thin-film solar cells — •Melanie Nichterwitz, Daniel Abou-Ras, Jürgen Bundesmann, Roland Scheer, and Hans-Werner Schock — Hahn-Meitner-Institut Berlin, Germany

Electron back scatter diffraction (EBSD) and electron beam-induced current (EBIC) in a scanning electron microscope are powerful tools to investigate the structural and electrical properties of polished cross sections of Cu(In,Ga)Se₂ thin-film solar cells. Electron beam induced current measurements allow for the analysis of the charge carrier transport with a high spatial resolution and the extraction of the minority charge carrier diffusion length. In combination with EBSD, it was possible to gain information about the influence of grain boundaries on the current collection of Cu(In,Ga)Se₂ thin-film solar cells. At several positions, reduced EBIC signals correlate with the positions of grain boundaries, as located by means of EBSD. These grain boundaries are identified as regions of enhanced recombination. Solar cells with various chemical compositions of the Cu(In,Ga)Se₂ absorbers were studied.