Berlin 2008 – scientific programme
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HL: Fachverband Halbleiterphysik
HL 23: Quantum dots and wires: Transport properties I
HL 23.5: Talk
Tuesday, February 26, 2008, 12:00–12:15, EW 201
Determination of the specific resistance of individual freestanding ZnO nanowires with the low energy electron point source microscope — •Dirk Henning Weber1, André Beyer1, Berthold Völkel1, Eva Schlenker2, Andrey Bakin2, Andreas Waag2, and Armin Gölzhäuser1 — 1Physik supramolekularer Systeme, Universität Bielefeld — 2Institut für Halbleitertechnik, Technische Universität Braunschweig
A low energy electron point source (LEEPS) microscope is used to determine the electrical conductivity of individual freestanding ZnO nanowires in UHV. The nanowires were contacted with a manipulation tip and I-V curves were taken at different wire lengths. From those, the specific resistance was calculated and separated from the contact resistance. By comparing the specific resistances of ZnO nanowires with diameters between 1100 and 48 nm, a large surface contribution for the thin nanowires was found. A geometric model for separation between surface and bulk contributions is given. The results of electrical transport measurements on vapor phase grown ZnO nanowires will be discussed, as well as the size dependence of the wire resistance.