Berlin 2008 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 31: Poster II

HL 31.53: Poster

Dienstag, 26. Februar 2008, 16:30–19:00, Poster D

Electrical and Mass transport in multi-wall carbon nanotubes — •Markus Löffler, Uhland Weißker, Thomas Mühl, Thomas Gemming, Rüdiger Klingeler, and Bernd Büchner — IFW Dresden, D-01069 Dresden, Germany

Electrical transport and concomitant mass transport in multi-wall carbon nanotubes (MWCNT) has been studied in a transmission electron microscope (TEM) using the tip of an in-situ scanning tunneling microscope (STM). Mass transport driven by electromigration has been observed. Contact resistances, which are of great influence in 2-point measurement setups, have been reduced by current-driven annealing. Furthermore, breakdown current densities of empty MWCNT have been determined. This work presents a starting point for measuring important electronic and electromechanical properties of filled and/or doped carbon and oxide-based nanoscale materials.