Berlin 2008 – wissenschaftliches Programm

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MA: Fachverband Magnetismus

MA 18: Poster I : Bio Magn. (1-2); Mag.Imgaging (3-9); Magn. Semiconductors (10-16); Half Metals & Oxides (17-20); Coupl.Phenomena (21-27); Magn. Mat. (28-41); Micro & Nanostr. Magn. Materials (42-61); Micro Magn. (62-64); Surface Magnetism (65-70); Transport Phenomena (71-85)

MA 18.9: Poster

Dienstag, 26. Februar 2008, 15:15–18:30, Poster E

XRMR and ReMagX - New tools to tackle magnetic reflectivity — •Sebastian Brück, Bernd Ludescher, Sebastian Macke, and Eberhard Goering — Max Planck Institute for Metals Research, Heisenbergstrasse 3, D-70569 Stuttgart, Germany

Magnetic circular dichroism is one of the most versatile techniques for the investigation of magnetic samples. Especially its application to existing techniques like x-ray reflectivity (XRR) constitutes this claim. Resonant x-ray magnetic reflectivity with circularly polarized light (XRMR) adds an additional contrast to the reflectivity spectra and one can obtain chemical as well as magnetic depth profiles of the sample. Recently this technique has attracted much attention due to its outstanding ability to investigate element specific magnetic effects even at buried interfaces. We present a new experimental setup for the investigation of soft-x-ray magnetic reflectivity from thin-film samples. Optimized to be as versatile as possible its key features are: a temperature range from 30K up to 500K, magnetic fields up to 0.5T at a field resolution better 0.5mT, motor driven azimuthal sample rotation, and a fast load lock and UHV transfer. In terms of data analysis conventional XRR uses the so called Parratt algorithm. The additional resonant magnetic contrast, surface and magnetic roughness phenomena require a more sophisticated approach. In the last years we have developed a powerful software tool to simulate and fit magnetic reflectivity spectra, which has been extended on the basis of the 4x4 matrix formalism. We will present recent experimental and fit results of FeMn/Co and NiCoO/Co exchange bias systems.