Berlin 2008 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Downloads | Hilfe
MA: Fachverband Magnetismus
MA 4: Magnetic Coupling Phenomena; Exchange Bias
MA 4.6: Vortrag
Montag, 25. Februar 2008, 11:30–11:45, H 1028
The strong correlation between structural properties of the buffer layer and the exchange bias phenomena — •Maciej Oskar Liedke, Valentina Cantelli, Jörg Grenzer, Daniel Markó, Arndt Mücklich, and Jürgen Fassbender — FZ Dresden-Rossendorf, Institute of Ion Beam Physics and Materials Research, Bautzner Landstr. 128, 01328 Dresden, Germany
The exchange coupling strength as a function of the buffer layer thickness is investigated for several carefully chosen seed materials. The crystal microstructure of the ferromagnetic(FM)-antiferromagnetic(AF) interface is directly related to the roughness and dimensionality of the buffer layer surface, which scales not only with such parameters as a texture and grain sizes but can be discussed as well in the frame of the wetting behavior of subsequent films. Particularly, it is shown that strong wetting between the substrate and the next layer can decrease the surface dimensionality and improve the growth conditions for the subsequent films. Thus, the smoothness of the FM-AF interface improves significantly which leads to a much stronger exchange coupling across the interface. In addition, it is demonstrated that the magnitude of the exchange bias is proportional to the grain sizes distribution, which is in good agreement with theoretical predictions.