Berlin 2008 – scientific programme
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MA: Fachverband Magnetismus
MA 4: Magnetic Coupling Phenomena; Exchange Bias
MA 4.9: Talk
Monday, February 25, 2008, 12:15–12:30, H 1028
Magnetic structure and domain walls of coupled antiferromagnetic films investigated by PEEM using polarized soft x-rays — •Ingo P. Krug1, Franz U. Hillebrecht1, Maurits W. Haverkort2, Arata Tanaka3, Liu H. Tjeng2, Helen Gomonaj4, and Claus M. Schneider1 — 1IFF-9 "Elektronische Eigenschaften", Forschungszentrum Jülich GmbH — 2PI-II, Univ. Köln — 3Dept. of Quantum Matt., ADSM, Hiroshima Univ. - Higashi-Hiroshima, 739-8530, Japan — 4Bogolyubov Inst. for Theor. Phys. NAS of Ukraine - st. Metrologichna, 14-b, 03143, Kiev, Ukraine
Antiferromagnetic (AF) thin films have a large potential for application in spintronics, as for example as pinning layers in spin-valves or , if insulating, as barriers in magnetic tunnel junctions. Unlike ferromagnets, these materials have no net magnetic moment, limiting the means of access to few techniques. Among them, one of the most powerful is PEEM using polarized soft x-rays, which can provide element-sensitive information about the AF domain state and – as a special focus in this work – the AF domain walls. The magnetic structure of the latter is in many cases still unknown. In this work, we provide an overview over the magnetic properties of epitaxial antiferromagnetic NiO films coupled to single crystalline magnetite substrates. We will show details of the interfacial and bulk magnetic structure of those layers gained by evaluation of the linear dichroism and discuss the influence of the crystallographic interface orientation. In a second step we will evaluate the magnetic structure of the constrained antiferromagnetic domain walls arising in the AF due to the interfacial coupling.