Berlin 2008 – scientific programme
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MA: Fachverband Magnetismus
MA 8: Magnetic Imaging
MA 8.5: Talk
Monday, February 25, 2008, 16:15–16:30, H 1012
Standard samples to determine the influence of external in-plane magnetic fields on magnetic force microscopy probes — •Tanja Weis1, Dieter Engel1, Arno Ehresmann1, Volker Höink2, Jan Schmalhorst2, and Günter Reiss2 — 1Department of Physics and Center for Interdisciplinary Nanostructure Science and Technology (CINSaT), University of Kassel, Heinrich-Plett-Str. 40, D-34132 Kassel — 2University of Bielefeld, Department of Physics, Nano Device Group, P.O. Box 100131, D-33501 Bielefeld
Analyzing magnetic force microscopy images measured in external in-plane magnetic fields is always hampered by the tilt of the magnetic moment of the MFM tip due to the external magnetic fields. To determine this tilt we use magnetically patterned samples whose magnetic state is independent on the magnetic field in a certain field range. For the fabrication of such topographically planar patterns we used standard lithography methods and keV He ion bombardment of exchange biased bilayers. We will present the production of standard samples and a procedure to determine the influence of external in-plane magnetic fields on the magnetic dipole moment of MFM tips.